Self-calibrating on-chip interconnects

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Abstract/Contents

Abstract
This dissertation covers the conception, design and evaluation of the self-calibrating interconnect, a new type of capacitively-driven on-chip interconnect that uses feedback and charge-pumps to automatically neutralize receiver offsets caused by device mismatch. It can operate with extremely low signal swings, which minimizes energy, without compromising reliability. A 2 mm long prototype built in a 90 nm low-power CMOS process consumes 77 fJ/bit of energy at 1.5 GHz, and sustains a bit-error rate (BER) below 10^-30 with just 32 mV of swing. We also present a new way to reduce the noise level of comparators by adjusting the size of the precharge devices. For a given energy budget, we demonstrate that by upsizing the precharge devices we can reduce the input-referred thermal noise of the popular StrongARM latch by up to 30% over previously known sizing techniques.

Description

Type of resource text
Form electronic; electronic resource; remote
Extent 1 online resource.
Publication date 2012
Issuance monographic
Language English

Creators/Contributors

Associated with Chen, James
Associated with Stanford University, Department of Electrical Engineering
Primary advisor Dally, William
Primary advisor Horowitz, Mark (Mark Alan)
Thesis advisor Dally, William
Thesis advisor Horowitz, Mark (Mark Alan)
Thesis advisor Wooley, Bruce A, 1943-
Advisor Wooley, Bruce A, 1943-

Subjects

Genre Theses

Bibliographic information

Statement of responsibility James Chen.
Note Submitted to the Department of Electrical Engineering.
Thesis Ph.D. Stanford University 2012
Location electronic resource

Access conditions

Copyright
© 2012 by James Chen
License
This work is licensed under a Creative Commons Attribution Non Commercial 3.0 Unported license (CC BY-NC).

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