Data for: Torsional Force Microscopy of Van der Waals Moires and Atomic Lattices
Abstract/Contents
- Abstract
- In a stack of atomically-thin Van der Waals layers, introducing interlayer twist creates a moire superlattice whose period is a function of twist angle. Changes in that twist angle of even hundredths of a degree can dramatically transform the system’s electronic properties. Setting a precise and uniform twist angle for a stack remains difficult, hence determining that twist angle and mapping its spatial variation is very important. Techniques have emerged to do this by imaging the moire, but most of these require sophisticated infrastructure, time-consuming sample preparation beyond stack synthesis, or both. In this work, we show that Torsional Force Microscopy (TFM), a scanning probe technique sensitive to dynamic friction, can reveal surface and shallow subsurface structure of Van der Waals stacks on multiple length scales: the moires formed between bi-layers of graphene and between graphene and hexagonal boron nitride (hBN), and also the atomic crystal lattices of graphene and hBN. In TFM, torsional motion of an AFM cantilever is monitored as the it is actively driven at a torsional resonance while a feedback loop maintains contact at a set force with the surface of a sample. TFM works at room temperature in air, with no need for an electrical bias between the tip and the sample, making it applicable to a wide array of samples. It should enable determination of precise structural information including twist angles and strain in moire superlattices and crystallographic orientation of VdW flakes to support predictable moire heterostructure fabrication.
Description
| Type of resource | Dataset, text |
|---|---|
| Date modified | December 13, 2023; December 13, 2023 |
| Publication date | August 15, 2023 |
Creators/Contributors
| Author | Pendharkar, Mihir |
https://orcid.org/0000-0003-1857-6131
(unverified)
|
|---|---|---|
| Author | Tran, Steven J. | |
| Author | Zaborski Jr., Gregory | |
| Author | Finney, Joe | |
| Author | Sharpe, Aaron L. | |
| Author | Kamat, Rupini V. | |
| Author | Kalantre, Sandesh S. | |
| Author | Hocking, Marisa | |
| Author | Bittner, Nathan |
https://orcid.org/0009-0005-7120-0661
(unverified)
|
| Author | Watanabe, Kenji | |
| Author | Taniguchi, Takashi | |
| Author | Pittenger, Bede | |
| Author | Newcomb, Christina J. | |
| Author | Kastner, Marc A. | |
| Author | Mannix, Andrew J. | |
| Author | Goldhaber-Gordon, David |
Subjects
| Subject | Torsional Force Microscopy |
|---|---|
| Subject | Moire Superlattices |
| Subject | Van der Waals materials |
| Genre | Data |
| Genre | Tabular data |
| Genre | Data sets |
| Genre | Dataset |
| Genre | Tables (data) |
Bibliographic information
| Related item | |
|---|---|
| DOI | https://doi.org/10.25740/zj475qr8207 |
| Location | https://purl.stanford.edu/zj475qr8207 |
Access conditions
- Use and reproduction
- User agrees that, where applicable, content will not be used to identify or to otherwise infringe the privacy or confidentiality rights of individuals. Content distributed via the Stanford Digital Repository may be subject to additional license and use restrictions applied by the depositor.
- License
- This work is licensed under a Creative Commons Attribution 4.0 International license (CC BY).
Preferred citation
- Preferred citation
- Pendharkar, M., Tran, S., Zaborski Jr., G., Finney, J., Sharpe, A., Kamat, R., Kalantre, S., Hocking, M., Bittner, N., Watanabe, K., Taniguchi, T., Pittenger, B., Newcomb, C., Kastner, M., Mannix, A., and Goldhaber-Gordon, D. (2023). Data for: Torsional Force Microscopy of Van der Waals Moires and Atomic Lattices. Stanford Digital Repository. Available at https://purl.stanford.edu/zj475qr8207. https://doi.org/10.25740/zj475qr8207.
Collection
Stanford Research Data
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- Contact
- mihirpen@stanford.edu
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