Investigating structure property relations in compound semiconductors using single nanowire devices
Abstract/Contents
- Abstract
- Semiconductor nanowires are an important class of materials. They have been used in a huge number of applications in the information, energy and medical sciences, and they also offer unique opportunities to study the large number of fundamental physical processes whose basic mechanisms operate on the nanoscale. Great progress has been made in the synthesis of these nanowires and the fabrication necessary to integrate them into top-down architectures; however, fully accounting for structural heterogeneity and understanding processing induced structural changes in these materials remains a challenge. A new approach to investigating structure property relationships combining in-situ transmission electron microscope (TEM) techniques with single nanowire devices and test structures fabricated on electron transparent membranes will be presented, and example studies on several metal chalcogenide materials for use in nonvolatile memory and thin film photovoltaics will be discussed. Several emerging strategies for nonvolatile information storage rely on systems in which an active element can be reversibly actuated between two structural states which can then be electronically distinguished. Gaining fundamental understanding of these systems requires an understanding of these different structural states, how they give rise to the required electronic properties, as well as the dynamics of the reversible process used to actuate the active element. In order to reach the high integration densities required to compete with existing technologies, these active elements must be on the nanoscale. To probe the materials science of two such candidate systems, silver selenide for pulsed electrochemical cell memory and germanium telluride for phase change memory, nanowires were synthesized and single nanowire memory devices were fabricated on electron transparent 50 nm thick silicon nitride substrates for ex-situ and in-situ experiments in the TEM. Currently, the world record power conversion efficiency, 20%, for a thin film photovoltaic device is held by the complicated quaternary material copper indium gallium selenide (CIGS). This excellent performance is not yet clearly understood, but may arise in large part due to the unique nature of the internal boundaries in CIGS materials. In order to understand the complicated relationship between processing and interface structure in this material, extensive TEM studies were undertaken using a variety of single nanowire test structures and in-situ heating. The fundamental understanding obtained by these studies was leveraged both to synthesize high quality p-type copper indium selenide (CIS) nanowires, and also to fabricate for the first time a single nanowire CIS solar cell, an achievement which will serve as a powerful platform for fundamental investigation into this important materials system.
Description
| Type of resource | text |
|---|---|
| Form | electronic; electronic resource; remote |
| Extent | 1 online resource. |
| Publication date | 2010 |
| Issuance | monographic |
| Language | English |
Creators/Contributors
| Associated with | Schoen, David Taylor |
|---|---|
| Associated with | Stanford University, Department of Materials Science and Engineering |
| Primary advisor | Cui, Yi, 1976- |
| Thesis advisor | Cui, Yi, 1976- |
| Thesis advisor | Brongersma, Mark L |
| Thesis advisor | McIntyre, Paul Cameron |
| Advisor | Brongersma, Mark L |
| Advisor | McIntyre, Paul Cameron |
Subjects
| Genre | Theses |
|---|
Bibliographic information
| Statement of responsibility | David Taylor Schoen. |
|---|---|
| Note | Submitted to the Department of Materials Science and Engineering. |
| Thesis | Thesis (Ph.D.)--Stanford University, 2010. |
| Location | electronic resource |
Access conditions
- Copyright
- © 2010 by David Taylor Schoen
- License
- This work is licensed under a Creative Commons Attribution Non Commercial 3.0 Unported license (CC BY-NC).
Also listed in
Loading usage metrics...