Ultrafast X-ray tomography of breathing mode excitations in semiconductor nanocrystals

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Abstract/Contents

Abstract
Femtosecond x-ray scattering techniques are used to directly visualize ultrafast strains and changes in atomic-scale structure in nanoscale CdSe and CdS spheres and rods. We construct a tomographic view of photo-induced lattice displacements and nanoscale shape changes by measuring multiple lattice reflections. Large amplitude tensile strains at the percent level are observed, associated with a rapid expansion followed by contraction along the nanocrystal radial direction. These morphological changes occur simultaneously with the first steps in the melting transition on hundreds of femtosecond time-scales. This work represents the first direct, real-time probe of the dynamics of these strains in few-nanometer scale particles, with bulk thermodynamic elastic constants remaining sufficient to describe their response despite the extreme excitation conditions.

Description

Type of resource text
Form electronic; electronic resource; remote
Extent 1 online resource.
Publication date 2014
Issuance monographic
Language English

Creators/Contributors

Associated with Szilágyi, Erzsi
Associated with Stanford University, Department of Chemistry.
Primary advisor Lindenberg, Aaron Michael
Thesis advisor Lindenberg, Aaron Michael
Thesis advisor Hodgson, Keith
Thesis advisor Pande, Vijay
Advisor Hodgson, Keith
Advisor Pande, Vijay

Subjects

Genre Theses

Bibliographic information

Statement of responsibility Erzsi Szilágyi.
Note Submitted to the Department of Chemistry.
Thesis Thesis (Ph.D.)--Stanford University, 2014.
Location electronic resource

Access conditions

Copyright
© 2014 by Elizabeth Marie Szilagyi
License
This work is licensed under a Creative Commons Attribution Non Commercial 3.0 Unported license (CC BY-NC).

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