Ultrafast X-ray tomography of breathing mode excitations in semiconductor nanocrystals
Abstract/Contents
- Abstract
- Femtosecond x-ray scattering techniques are used to directly visualize ultrafast strains and changes in atomic-scale structure in nanoscale CdSe and CdS spheres and rods. We construct a tomographic view of photo-induced lattice displacements and nanoscale shape changes by measuring multiple lattice reflections. Large amplitude tensile strains at the percent level are observed, associated with a rapid expansion followed by contraction along the nanocrystal radial direction. These morphological changes occur simultaneously with the first steps in the melting transition on hundreds of femtosecond time-scales. This work represents the first direct, real-time probe of the dynamics of these strains in few-nanometer scale particles, with bulk thermodynamic elastic constants remaining sufficient to describe their response despite the extreme excitation conditions.
Description
Type of resource | text |
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Form | electronic; electronic resource; remote |
Extent | 1 online resource. |
Publication date | 2014 |
Issuance | monographic |
Language | English |
Creators/Contributors
Associated with | Szilágyi, Erzsi |
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Associated with | Stanford University, Department of Chemistry. |
Primary advisor | Lindenberg, Aaron Michael |
Thesis advisor | Lindenberg, Aaron Michael |
Thesis advisor | Hodgson, Keith |
Thesis advisor | Pande, Vijay |
Advisor | Hodgson, Keith |
Advisor | Pande, Vijay |
Subjects
Genre | Theses |
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Bibliographic information
Statement of responsibility | Erzsi Szilágyi. |
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Note | Submitted to the Department of Chemistry. |
Thesis | Thesis (Ph.D.)--Stanford University, 2014. |
Location | electronic resource |
Access conditions
- Copyright
- © 2014 by Elizabeth Marie Szilagyi
- License
- This work is licensed under a Creative Commons Attribution Non Commercial 3.0 Unported license (CC BY-NC).
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