In-situ calibration and direct de-embedding of RF integrated circuits and microwave structures using self-compensating techniques
Abstract/Contents
- Abstract
- Characterization of on-wafer or system-on-chip RF devices and structures usually requires the use of an external calibration substrate followed by measurements and application of de-embedding techniques. While different de-embedding techniques have been published, none of them provides calibration and de-embedding in a single step. In this work an In-situ and self-compensating method that provides calibration and direct de-embedding is presented. This method relies on the integration of calibration and verification structures along with the device under test (DUT). Characterization or accurate modeling of a single standard allows reference-plane setting at the input/output ports of the DUT and direct measurement and de-embedding of the intrinsic DUT while embedded verification standards ensure validity of the calibration coefficients. Furthermore, the embedded verification structures can be used to implement an iterative method for determining the reactive element of the required single standard with nearly no constraints and the compactness of a self-contained test bench where the effects of any probing interface can be directly calibrated out in a single-step operation and without requiring separate measurement and/or modeling of each structure between the DUT and the probing point. Simulation and lab measurements ranging from the low MHz region up to V-band (67GHz) demonstrate that the new method is valid for direct extraction of DUT data without the need for separate calibration and de-embedding steps or external calibration substrates and with the advantage of being able to control the position of the reference plane by fulfilling very simple layout requirements. In addition, it also presents a direct method for detecting and possibly correcting the unavoidable probe displacement that affects most of the manual and automatic probe stations used for circuit and device characterization. This probe displacement detection technique treats mechanical shifts as deviations of a first set of complex solutions that would initially result in a fully balanced system. The only requirement for the implementation of this technique is the inclusion of a set of wideband coupled lines that allow direct sensing of the incident and reflected waves and a reference signal for phase and relative amplitude measurements. Moreover, this technique does not require any calibration process other than being able to store the initial state of the test system, an initial set of solutions and the actual solutions to the current state of the test system.
Description
| Type of resource | text |
|---|---|
| Form | electronic; electronic resource; remote |
| Extent | 1 online resource. |
| Publication date | 2010 |
| Issuance | monographic |
| Language | English |
Creators/Contributors
| Associated with | Martinez-Garcia, Isaac |
|---|---|
| Associated with | Stanford University, Department of Electrical Engineering |
| Primary advisor | Dutton, Robert W |
| Thesis advisor | Dutton, Robert W |
| Thesis advisor | Howe, Roger Thomas |
| Thesis advisor | Wong, S |
| Advisor | Howe, Roger Thomas |
| Advisor | Wong, S |
Subjects
| Genre | Theses |
|---|
Bibliographic information
| Statement of responsibility | Isaac Martinez-Garcia. |
|---|---|
| Note | Submitted to the Department of Electrical Engineering. |
| Thesis | Thesis (Ph. D.)--Stanford University, 2010. |
| Location | electronic resource |
Access conditions
- Copyright
- © 2010 by Isaac Martinez Garcia
- License
- This work is licensed under a Creative Commons Attribution Non Commercial 3.0 Unported license (CC BY-NC).
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