Understanding inhibitor-based area selective atomic layer deposition for dielectric-on-dielectric growth

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Abstract/Contents

Abstract
Electronic device fabrication today is based on 'top-down' processes with multiple lithography and etching steps. As semiconductor dimensions shrink and adopt more complex architectures, these processes are reaching their limits. One promising solution is area-selective atomic layer deposition (AS-ALD), which combines a surface modification technique and atomic layer deposition (ALD) in a 'bottom-up' approach to nanopatterning. A common approach for achieving AS-ALD involves the use of densely-packed self-assembled monolayers (SAMs) as inhibiting layers against undesired ALD growth. Incorporating this technique into fabrication schemes requires an understanding of how SAMs interact with different surfaces and how this in turn affects the ability of the SAM to act as an effective inhibitor against ALD reactions. In the first part of this thesis, a comparative study of octadecylphosphonic acid (ODPA) SAM formation on four technologically relevant metals— Cu, Co, W and Ru—was carried out. Following SAM deposition, zinc oxide (ZnO) and aluminum oxide (Al2O3) model ALD processes were performed to assess the blocking ability of the SAM layer formed on each substrate. Surface characterization of these samples revealed that ODPA-treated Cu, Co and W inhibited the growth of ZnO and Al2O3 ALD to varying degrees, while no inhibition was observed on ODPA-treated Ru. Specifically, the ODPA-treated W prevented the growth of at least 17 nm of ZnO, compared to less than half this amount on Co and Cu. Similarly, 3-4 times more Al2O3 ALD was blocked using ODPA on W versus Cu and Co. The reaction mechanism of ODPA SAM formation and how surface properties, such as the roughness and the Lewis acid nature of the substrate, could impact that SAM's formation and in turn ALD inhibition is discussed. In the second part, a series of spectroscopic analyses were performed which provide details about the structure and coverage of the ODPA layer formed on each substrate. It was determined that the average tilt angle of the ODPA chains formed on Co, Cu and W are ~66° from the surface plane of the substrate, indicating that (on average) the molecules are oriented upright. Conversely, ODPA chains on the Ru substrate were found to be disordered. Further, it was determined that ODPA on Co and Cu formed a densely packed 'crystal-like' structure while on W and Ru, the ODPA molecules appeared to exhibit a more 'liquid-like' structure. The data indicate that although ODPA forms an incomplete layer on W, it still provides the best blocking against ZnO and Al2O3. The results highlight the importance of the chemical nature of the substrate surface in achieving SAM-based AS-ALD. Finally, since the overarching goal of this research is to achieve AS-ALD on metal/dielectric patterns (which mimic interconnect devices), the selective growth of ZnO and Al2O3 was demonstrated on Cu/SiO2 and Co/SiO2 2D-patterned substrates. Challenges in achieving SAM-assisted selective ALD and methods to improve the process on smaller feature sizes are also discussed

Description

Type of resource text
Form electronic resource; remote; computer; online resource
Extent 1 online resource
Place California
Place [Stanford, California]
Publisher [Stanford University]
Copyright date 2020; ©2020
Publication date 2020; 2020
Issuance monographic
Language English

Creators/Contributors

Author Bobb-Semple, Dara A
Degree supervisor Bent, Stacey
Thesis advisor Bent, Stacey
Thesis advisor Jaramillo, Thomas Francisco
Thesis advisor Qin, Jian, (Professor of Chemical Engineering)
Degree committee member Jaramillo, Thomas Francisco
Degree committee member Qin, Jian, (Professor of Chemical Engineering)
Associated with Stanford University, Department of Chemical Engineering.

Subjects

Genre Theses
Genre Text

Bibliographic information

Statement of responsibility Dara Bobb-Semple
Note Submitted to the Department of Chemical Engineering
Thesis Thesis Ph.D. Stanford University 2020
Location electronic resource

Access conditions

Copyright
© 2020 by Dara A. Bobb-Semple
License
This work is licensed under a Creative Commons Attribution Non Commercial 3.0 Unported license (CC BY-NC).

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