Understanding material limits for encapsulated combo sensor design and fabrication

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Abstract/Contents

Abstract
Due to growing demand in the consumer space, there has been a push to create combo sensors and to reduce overall chip size. The 'epi-seal' process, developed by Robert Bosch GmBH and Stanford University, enables wafer-scale packaging of devices in an environment that has shown no long-term aging effects, using a thin-film encapsulation that results in the smallest reported package size. In order for this process to become truly viable for co-fabrication of sensors with different design constraints, we made several process modifications to produce sensors with high-sensitivity but low cross-sensitivity between different environmental factors. To prove this concept, we co-fabricate X/Y and Z-axis accelerometers, a pressure sensor, and resonant thermometer, where cross-sensitivity is improved by more than 700x; remaining cross-sensitivities can then be compensated based on real-time measurements from other sensors. In order for sensors to scale down and sustain sensitivity performance, I examine two material limits that can be prohibitive to sensor miniaturization: stiction and fatigue. Stiction studies with as-fabricated epi-seal devices reveal adhesion forces between contacting surfaces that are asperity-dominated and on average 35 μN. In order to overcome this force, I investigate several dynamic anti-stiction methods that lead to effective stiction forces being reduced by over 60%. Fatigue studies using high-displacement resonators fabricated in the epi-seal process were performed to observe any potential aging effects in single-crystal silicon. In contrast to literature, long-term (> 10^10 cycles) fatigue experiments with these devices showed no signs of fatigue damage up to 7.5 GPa. A cross-comparison with these literature results reveals that fatigue can indeed be prevented, only with atomically smooth side-walled devices that are fabricated in a packaging technology that prevents stress corrosion.

Description

Type of resource text
Form electronic; electronic resource; remote
Extent 1 online resource.
Publication date 2016
Issuance monographic
Language English

Creators/Contributors

Associated with Hong, Vu Anh
Associated with Stanford University, Department of Mechanical Engineering.
Primary advisor Kenny, Thomas William
Thesis advisor Kenny, Thomas William
Thesis advisor Howe, Roger Thomas
Thesis advisor Nelson, Drew
Advisor Howe, Roger Thomas
Advisor Nelson, Drew

Subjects

Genre Theses

Bibliographic information

Statement of responsibility Vu Anh Hong.
Note Submitted to the Department of Mechanical Engineering.
Thesis Thesis (Ph.D.)--Stanford University, 2016.
Location electronic resource

Access conditions

Copyright
© 2016 by Vu Anh Hong
License
This work is licensed under a Creative Commons Attribution Non Commercial 3.0 Unported license (CC BY-NC).

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