New optics for low-damage electron microscopy

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Abstract/Contents

Abstract
While transmission electron microscopes are in principle capable of atomic resolution, the practical resolution limit for many samples of critical interest (i.e. biological molecules, polymers, battery materials) is determined by beam-induced damage. This leads to a dose-limited resolution far inferior to the resolution limit set by diffraction and aberrations. Multi-Pass Transmission Electron Microscopy (MPTEM) is a new technique for improving dose-limited resolution. I will motivate MPTEM with theory and simulation and present a detailed design of the novel optical elements which enable this protocol. I will also discuss the design of a programmable electron phase plate, which controls electron wavefronts and enables a variety of new measurement techniques. Finally, I will describe a new approach to understanding phase imaging for strongly scattering samples, which will be critical for extracting the maximum possible information from a multi-pass measurement.

Description

Type of resource text
Form electronic resource; remote; computer; online resource
Extent 1 online resource.
Place California
Place [Stanford, California]
Publisher [Stanford University]
Copyright date 2021; ©2021
Publication date 2021; 2021
Issuance monographic
Language English

Creators/Contributors

Author Koppell, Stewart
Degree supervisor Kasevich, Mark A
Thesis advisor Kasevich, Mark A
Thesis advisor Chu, Steven
Thesis advisor Schleier-Smith, Monika
Degree committee member Chu, Steven
Degree committee member Schleier-Smith, Monika
Associated with Stanford University, Department of Applied Physics

Subjects

Genre Theses
Genre Text

Bibliographic information

Statement of responsibility Stewart Koppell.
Note Submitted to the Department of Applied Physics.
Thesis Thesis Ph.D. Stanford University 2021.
Location https://purl.stanford.edu/pt156hx6644

Access conditions

Copyright
© 2021 by Stewart Koppell
License
This work is licensed under a Creative Commons Attribution Non Commercial 3.0 Unported license (CC BY-NC).

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