New optics for low-damage electron microscopy
Abstract/Contents
- Abstract
- While transmission electron microscopes are in principle capable of atomic resolution, the practical resolution limit for many samples of critical interest (i.e. biological molecules, polymers, battery materials) is determined by beam-induced damage. This leads to a dose-limited resolution far inferior to the resolution limit set by diffraction and aberrations. Multi-Pass Transmission Electron Microscopy (MPTEM) is a new technique for improving dose-limited resolution. I will motivate MPTEM with theory and simulation and present a detailed design of the novel optical elements which enable this protocol. I will also discuss the design of a programmable electron phase plate, which controls electron wavefronts and enables a variety of new measurement techniques. Finally, I will describe a new approach to understanding phase imaging for strongly scattering samples, which will be critical for extracting the maximum possible information from a multi-pass measurement.
Description
Type of resource | text |
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Form | electronic resource; remote; computer; online resource |
Extent | 1 online resource. |
Place | California |
Place | [Stanford, California] |
Publisher | [Stanford University] |
Copyright date | 2021; ©2021 |
Publication date | 2021; 2021 |
Issuance | monographic |
Language | English |
Creators/Contributors
Author | Koppell, Stewart |
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Degree supervisor | Kasevich, Mark A |
Thesis advisor | Kasevich, Mark A |
Thesis advisor | Chu, Steven |
Thesis advisor | Schleier-Smith, Monika |
Degree committee member | Chu, Steven |
Degree committee member | Schleier-Smith, Monika |
Associated with | Stanford University, Department of Applied Physics |
Subjects
Genre | Theses |
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Genre | Text |
Bibliographic information
Statement of responsibility | Stewart Koppell. |
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Note | Submitted to the Department of Applied Physics. |
Thesis | Thesis Ph.D. Stanford University 2021. |
Location | https://purl.stanford.edu/pt156hx6644 |
Access conditions
- Copyright
- © 2021 by Stewart Koppell
- License
- This work is licensed under a Creative Commons Attribution Non Commercial 3.0 Unported license (CC BY-NC).
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