Ion penetration in conjugated polymers : connecting structural effects and electronic transport

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Abstract/Contents

Abstract
Ionic liquids are increasingly employed as dielectrics to generate high charge densities and enable low-voltage operation with organic semiconductors. However, effects on structure and morphology of the active material are not fully known, particularly for permeable semiconductors such as conjugated polymers, in which ions from the ionic liquid can enter and electrochemically dope the semicrystalline film. To understand when ions enter, where they go, and how they affect the film, thin films of the archetypal semiconducting polymer, poly(3-hexylthiophene) (P3HT), are electrochemically doped with 1-ethyl-3-methylimidazolium bis(trifluoromethylsulfonyl)imide ([EMIM][TFSI]), the archetypal ionic liquid. High-resolution, ex situ x-ray diffraction measurements and complete pole figures reveal changes with applied voltage, cycling, and frequency in lattice spacing, crystallite orientation, and crystallinity in the bulk and at the buried interface. Dopant ions penetrate the film and enter the crystallites at sufficiently high voltages and low frequencies. Upon infiltrating crystallites, ions permanently expand lamellar stacking and contract pi-stacking. Cycling amplifies these effects, but higher frequencies mitigate the expansion of bulk crystallites as ions are hindered from entering crystallites. Important metrics for electronic transport such as mobility and drain current ON/OFF ratio are also affected following patterns analogous to those seen for lattice spacing and crystallinity under two operating regimes. This mechanistic understanding of the structural effects of ion penetration will help develop models of the frequency and voltage impedance response of electrochemically doped conjugated polymers and advanced electronic applications.

Description

Type of resource text
Form electronic resource; remote; computer; online resource
Extent 1 online resource.
Place California
Place [Stanford, California]
Publisher [Stanford University]
Copyright date 2019; ©2019
Publication date 2019; 2019
Issuance monographic
Language English

Creators/Contributors

Author Guardado, Jesus Omar
Degree supervisor Salleo, Alberto
Thesis advisor Salleo, Alberto
Thesis advisor Appel, Eric (Eric Andrew)
Thesis advisor Brongersma, Mark L
Degree committee member Appel, Eric (Eric Andrew)
Degree committee member Brongersma, Mark L
Associated with Stanford University, Department of Materials Science and Engineering.

Subjects

Genre Theses
Genre Text

Bibliographic information

Statement of responsibility Jesus Omar Guardado.
Note Submitted to the Department of Materials Science & Engineering.
Thesis Thesis Ph.D. Stanford University 2019.
Location electronic resource

Access conditions

Copyright
© 2019 by Jesus Omar Guardado
License
This work is licensed under a Creative Commons Attribution Non Commercial 3.0 Unported license (CC BY-NC).

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