Trapping ultracold gases near cryogenic materials with rapid reconfigurability

Placeholder Show Content

Abstract/Contents

Abstract
We demonstrate an atom chip trapping system that allows the placement and high-resolution imaging of ultracold atoms within microns of any 100 µm-thin, UHV-compatible material, while also allowing sample exchange with minimal experimental downtime. The sample is not connected to the atom chip, allowing rapid exchange without perturbing the atom chip or laser cooling apparatus. Exchange of the sample and retrapping of atoms has been performed within a week turnaround, limited only by chamber baking. Moreover, the decoupling of sample and atom chip provides the ability to independently tune the sample temperature and its position with respect to the trapped ultracold gas, which itself may remain in the focus of a high-resolution imaging system. As a first demonstration of this system, we have confined a 200-nK cloud of 10,000 rubidium 87 atoms within 100 µm of a gold-mirrored 100-µm-thick silicon substrate. The substrate was cooled to 35 K without use of a heat shield, while the atom chip, 100 µm away, remained at room temperature. Atoms may be imaged and retrapped every 16 s, allowing rapid data collection.

Description

Type of resource text
Form electronic; electronic resource; remote
Extent 1 online resource.
Publication date 2014
Issuance monographic
Language English

Creators/Contributors

Associated with Naides, Matthew
Associated with Stanford University, Department of Applied Physics.
Primary advisor Lev, Benjamin
Thesis advisor Lev, Benjamin
Thesis advisor Fisher, Ian
Thesis advisor Hollberg, Leo (Leo William)
Advisor Fisher, Ian
Advisor Hollberg, Leo (Leo William)

Subjects

Genre Theses

Bibliographic information

Statement of responsibility Matthew Naides.
Note Submitted to the Department of Applied Physics.
Thesis Thesis (Ph.D.)--Stanford University, 2014.
Location electronic resource

Access conditions

Copyright
© 2014 by Matthew Aaron Naides
License
This work is licensed under a Creative Commons Attribution Non Commercial 3.0 Unported license (CC BY-NC).

Also listed in

Loading usage metrics...