Thermal characterization and modeling of nanostructured materials

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Thermal conduction resistances are becoming increasingly complicated as advanced materials, photonics, and electronic devices incorporate more nanostructured features (e.g. carbon nanotubes (CNTs), ultra-thin films, nanoparticles, etc.). The reduced dimensions and large interface densities of nanostructured materials modify the energy transport physics, requiring the development of new thermal models and thermal metrology techniques with deep sub-micron spatial resolution. This research develops and applies ultra-fast (nanosecond thermoreflectance (TR) and picosecond time-domain thermoreflectance (TDTR)) to characterize thermal resistances in carbon nanotube arrays and thin-film materials. In conjunction, this work develops novel models of thermal transport within the nanostructured material and interfaces. Owing to their high intrinsic thermal conductivities (~3000 W/m/K), aligned arrays of CNTs are promising for use in advanced thermal interface materials. Nanosecond TR data for metal-coated aligned nanotube films show that the thermal resistance of the films is dominated by interfaces due to incomplete CNT-metal contact, and that the thermal resistance of these films can be significantly reduced by varying the metallic composition at the interface. This work presents data for the growth-interface thermal resistance of multiwalled carbon nanotubes measured directly using TDTR with a variable modulation frequency technique. The abrupt changes in geometry at nanostructured interfaces induce phonon confinement, which creates additional contributions to the interface resistance. This work investigates model problems of thermal transport through abrupt junctions between a one-dimensional lattice in contact with a two- and three-dimensional lattice using a Green's function approach. The model indicates that the thermal resistances due to dimensional mismatch are comparable to those due to material property mismatch effects. Finally, the results suggest that engineering an intentional impedance mismatch at a nanostructured interface may enhance the transmission of energy. This work also develops a picoseconds pump/probe thermoreflectance system to achieve deep sub-micron spatial resolution of thermal properties of ultra thin hafnium oxide films, which are promising for the next generation of gate oxides for transistors. These data isolate the intrinsic film resistance and show that crystalline nanoparticles reduce the intrinsic thermal conductivity its bulk value.


Type of resource text
Form electronic; electronic resource; remote
Extent 1 online resource.
Publication date 2010
Issuance monographic
Language English


Associated with Panzer, Matthew A
Associated with Stanford University, Department of Mechanical Engineering
Primary advisor Goodson, Kenneth E, 1967-
Thesis advisor Goodson, Kenneth E, 1967-
Thesis advisor Clemens, B. M. (Bruce M.)
Thesis advisor Prasher, Ravi
Advisor Clemens, B. M. (Bruce M.)
Advisor Prasher, Ravi


Genre Theses

Bibliographic information

Statement of responsibility Matthew A. Panzer.
Note Submitted to the Department of Mechanical Engineering.
Thesis Ph. D. Stanford University 2010
Location electronic resource

Access conditions

© 2010 by Matthew Alan Panzer
This work is licensed under a Creative Commons Attribution Non Commercial 3.0 Unported license (CC BY-NC).

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