The control of metal-insulator transition in vanadium dioxide

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Abstract/Contents

Abstract
The external control of the conductivity of correlated oxides is one of the most promising avenues towards realizing energy-efficient electronic devices. One of the prime candidates for such devices, vanadium dioxide (VO2), undergoes a temperature-driven metal-insulator transition (MIT) near room temperature (~340 K) with a concomitant change in crystal symmetry. First, using epitaxial strain provided by a variable thickness RuO2 buffer layer, we vary the MIT transition temperature of VO2 (001) films continuously from ~285 to ~345 K. We show, using strain-, polarization- and temperature-dependent x-ray absorption spectroscopy, in conjunction with x-ray diffraction and electrical transport measurements, that the transition temperature (TMIT) of VO2 is controlled by the orbital occupancy in its metallic state. Our results furthermore indicate that the magnitude of the structural distortion across the transition is also directly related to the orbital occupation in the metallic state. This work opens up the possibility of controlling the nature of the conducting state in atomically thin VO2 layers by manipulating the orbital occupancy by, for example, hetero-structural engineering. In a related study, we have used a combination of electron-beam and optical lithography to fabricate lateral two-terminal nano-devices from VO2 films deposited on TiO2 (001) substrates without RuO2 buffer layers. In these devices, we show that the transition can also be engendered by the application of modest electric fields, several orders of magnitude below the electric breakdown field, making this phenomenon potentially useful for two or three terminal switches. The delay time before switching is found to decrease with increasing electric field and temperature. We discuss whether these results indicate the transition is dominated by electronic or by Joule heating effects. These results demonstrate the possibility of triggering an MIT at low voltages and, therefore, at low energies, which is essential for device applications. Finally, we also discuss MIT in VO2-TiO2 based hetero-structures. We show that the temperature-driven MIT persists in VO2 films as thin as 1.8 nm.

Description

Type of resource text
Form electronic; electronic resource; remote
Extent 1 online resource.
Publication date 2013
Issuance monographic
Language English

Creators/Contributors

Associated with Aetukuri, Naga Phani B
Associated with Stanford University, Department of Materials Science and Engineering.
Primary advisor Harris, J. S. (James Stewart), 1942-
Primary advisor McIntyre, Paul Cameron
Primary advisor Parkin, Stuart S. P
Thesis advisor Harris, J. S. (James Stewart), 1942-
Thesis advisor McIntyre, Paul Cameron
Thesis advisor Parkin, Stuart S. P

Subjects

Genre Theses

Bibliographic information

Statement of responsibility Naga Phani B. Aetukuri.
Note Submitted to the Department of Materials Science and Engineering.
Thesis Thesis (Ph.D.)--Stanford University, 2013.
Location electronic resource

Access conditions

Copyright
© 2013 by Naga Phani Babu Aetukuri
License
This work is licensed under a Creative Commons Attribution Non Commercial 3.0 Unported license (CC BY-NC).

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