Microwave impedance microscopy : from acoustics to photovoltaics
Abstract/Contents
- Abstract
- This thesis details my efforts to expand the capabilities of microwave impedance microscopy (MIM), and apply those capabilities to variety of systems of technological relevance. MIM is a sensitive microwave measurement of the change in impedance of a scanned, nanoscale probe. By measuring this impedance, properties of the sample under study, including conductivity and permittivity, can be obtained at nanoscale resolution without direct electrical contact. How this tip impedance relates to the quantities of interest can depend on many details of the measurement and measured device, however. In this thesis I explore some of those details. Chapter 1 includes the standard interpretation of MIM as a qualitative measurement of local permittivity and conductivity, in addition to background on related scanning probe methods. This understanding is largely sufficient for many systems, including the phase change materials (e.g. Ge2Sb2Te5) studied in Chapter 5. Such materials have dramatically different conductivities between their amorphous and crystalline states, making MIM an ideal tool for studying various types of phase change devices. Chapter 2 explores a number of measurement techniques and principles which can expand the capabilities of MIM and address some of its limitations, including quantitative measurement. A class of such techniques, those involving modulated optical illumination of the tip-sample interface during MIM measurement, is explored in detail in Chapter 4. These include MIM measurement of photoconductivity, band-gap, and carrier lifetime. Finally, chapter 3 covers the application of MIM to ferroelectric domains and domain walls. The primary topic of this chapter is the radically different measurement mechanism possible in piezoelectric materials, in which MIM can be used to measure the transduction of electrical energy to acoustic waves.
Description
| Type of resource | text |
|---|---|
| Form | electronic resource; remote; computer; online resource |
| Extent | 1 online resource. |
| Place | California |
| Place | [Stanford, California] |
| Publisher | [Stanford University] |
| Copyright date | 2018; ©2018 |
| Publication date | 2018; 2018 |
| Issuance | monographic |
| Language | English |
Creators/Contributors
| Author | Johnston, Scott R |
|---|---|
| Degree supervisor | Shen, Zhi-Xun |
| Thesis advisor | Shen, Zhi-Xun |
| Thesis advisor | Fox, John D |
| Thesis advisor | Suzuki, Yuri, (Applied physicist) |
| Degree committee member | Fox, John D |
| Degree committee member | Suzuki, Yuri, (Applied physicist) |
| Associated with | Stanford University, Department of Applied Physics. |
Subjects
| Genre | Theses |
|---|---|
| Genre | Text |
Bibliographic information
| Statement of responsibility | Scott R. Johnston. |
|---|---|
| Note | Submitted to the Department of Applied Physics. |
| Thesis | Thesis Ph.D. Stanford University 2018. |
| Location | electronic resource |
Access conditions
- Copyright
- © 2018 by Scott Johnston
- License
- This work is licensed under a Creative Commons Attribution Non Commercial 3.0 Unported license (CC BY-NC).
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