Exploiting non-linear Arrhenius dependence of diode IV curves to determine Schottky barrier band diagrams
Abstract/Contents
- Abstract
- Accurate extraction of Schottky barrier height is imperative to the development of low resistance contacts. An analytical model for current density is found that accurately accounts for conduction in the thermionic emission (TE), thermionic field emission (TFE), and field emission (FE) regimes. Use of this model in non-linear regression allows more information to be extracted from diode current-voltage-temperature (IVT) curves than previously possible. The proposed model uses the Arrhenius non-linear dependence experimental diode IV curves to regress the Schottky barrier height ([phi]B0), steepness factor (E00), and Fermi level ([xi]), enabling band diagrams of the measured interfaces to be determined. This model is tested against both simulated interfaces using the transmission matrix method (TMM) and experimental data. This complete picture of band information allows material interface behavior to be understood more completely, ultimately facilitating more efficient contact engineering.
Description
Type of resource | text |
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Form | electronic; electronic resource; remote |
Extent | 1 online resource. |
Publication date | 2012 |
Issuance | monographic |
Language | English |
Creators/Contributors
Associated with | Kenney, Crystal Rose |
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Associated with | Stanford University, Department of Electrical Engineering |
Primary advisor | Saraswat, Krishna |
Thesis advisor | Saraswat, Krishna |
Thesis advisor | Miller, D. A. B |
Thesis advisor | Wong, Hon-Sum Philip, 1959- |
Advisor | Miller, D. A. B |
Advisor | Wong, Hon-Sum Philip, 1959- |
Subjects
Genre | Theses |
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Bibliographic information
Statement of responsibility | Crystal Kenney. |
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Note | Submitted to the Department of Electrical Engineering. |
Thesis | Thesis (Ph.D.)--Stanford University, 2012. |
Location | electronic resource |
Access conditions
- Copyright
- © 2012 by Crystal Rose Kenney
- License
- This work is licensed under a Creative Commons Attribution Non Commercial 3.0 Unported license (CC BY-NC).
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